Scanning electron microscope (SEM) analysis

qualitative technique often used for the analysis of defects in polymeric materials and metals.

The SEM technique, literally Scanning Electronical Microscopy, exploits the excitation of the electrons inside the atoms of the sample to take a “photograph” of the piece at the time of analysis.

Thanks to this technique it is possible to identify the breaking points of a piece, for example for the failure analysis and to hypothesize the cause of the breakage.

Another objective may also be to evaluate any contamination of metal particles inside plastic components, performing the test in combination with the metallization of the component and subsequent EDS analysis.

You can also perform a qualitative evaluation of metals and alloys, metallographic phases and evaluation of cracks.

The advantages of the technique are ease of use and little or no preparation of the sample to be tested..